Résultat(s) 1 - 7 résultats de 7 pour la requête 'Isomura, Noritake', Temps de recherche: 1,39s Affiner les résultats
  1. 1
    Local atomic structure analysis around Mg atom doped in GaN by X-ray absorption spectroscopy and spectrum simulations

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  2. 2
    A practical method for determining film thickness using X-ray absorption spectroscopy in total electron yield mode

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  3. 3
    Thickness of carbon coatings on silicon materials determined by hard X-ray photoelectron spectroscopy at multiple photon energies

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  4. 4
    Local atomic structure analysis of GaN surfaces via X-ray absorption spectroscopy by detecting Auger electrons with low energies

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  5. 5
    Distinguishing nitrogen-containing sites in SiO2/4H-SiC(0001) after nitric oxide annealing by X-ray absorption spectroscopy

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  6. 6
    Surface EXAFS via differential electron yield

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  7. 7
    A new EXAFS method for the local structure analysis of low-Z elements

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