Local atomic structure analysis around Mg atom doped in GaN by X-ray absorption spectroscopy and spectrum simulations

The identification of the incorporated site of magnesium (Mg) and hydrogen (H) required for p-type formation in gallium nitride (GaN) power devices has been demonstrated by X-ray absorption spectroscopy (XAS). In this study, the fluorescence line of Mg with 3 × 1019 atoms cm-3 was successfully separ...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 28(2021), Pt 4 vom: 01. Juli, Seite 1114-1118
1. Verfasser: Isomura, Noritake (VerfasserIn)
Weitere Verfasser: Kimoto, Yasuji
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2021
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article X-ray absorption fine structure density functional theory dopants gallium nitride magnesium