X-ray diffraction from dislocation half-loops in epitaxial films
© Vladimir M. Kaganer 2024.
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 57(2024), Pt 2 vom: 01. Apr., Seite 276-283 |
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| 1. Verfasser: | |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2024
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article epitaxial films misfit dislocations strain relaxation threading dislocations |
| Zusammenfassung: | © Vladimir M. Kaganer 2024. X-ray diffraction from dislocation half-loops consisting of a misfit segment with two threading arms extending from it to the surface is calculated by the Monte Carlo method. The diffraction profiles and reciprocal space maps are controlled by the ratio of the total lengths of the misfit and the threading segments of the half-loops. A continuous transformation from the diffraction characteristic of misfit dislocations to that of threading dislocations with increasing thickness of epitaxial film is studied. Diffraction from dislocations with edge- and screw-type threading arms is considered and the contributions of the two types of dislocations are compared |
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| Beschreibung: | Date Revised 11.04.2024 published: Electronic-eCollection Citation Status PubMed-not-MEDLINE |
| ISSN: | 0021-8898 |
| DOI: | 10.1107/S160057672400089X |