Style de citation APA

Kaganer, V. M. (2024). X-ray diffraction from dislocation half-loops in epitaxial films. Journal of applied crystallography, 57(Pt 2), 276. https://doi.org/10.1107/S160057672400089X

Style de citation Chicago

Kaganer, Vladimir M. "X-ray Diffraction from Dislocation Half-loops in Epitaxial Films." Journal of Applied Crystallography 57, no. Pt 2 (2024): 276. https://dx.doi.org/10.1107/S160057672400089X.

Style de citation MLA

Kaganer, Vladimir M. "X-ray Diffraction from Dislocation Half-loops in Epitaxial Films." Journal of Applied Crystallography, vol. 57, no. Pt 2, 2024, p. 276.