A High-Entropy-Oxides-Based Memristor : Outstanding Resistive Switching Performance and Mechanisms in Atomic Structural Evolution

© 2023 Wiley-VCH GmbH.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 35(2023), 41 vom: 13. Okt., Seite e2302979
1. Verfasser: Tsai, Jing-Yuan (VerfasserIn)
Weitere Verfasser: Chen, Jui-Yuan, Huang, Chun-Wei, Lo, Hung-Yang, Ke, Wei-En, Chu, Ying-Hao, Wu, Wen-Wei
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2023
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article atomic-scale evolution high-entropy oxide resistive random-access memory resistive switching structural transformation
LEADER 01000naa a22002652 4500
001 NLM358799481
003 DE-627
005 20231226075516.0
007 cr uuu---uuuuu
008 231226s2023 xx |||||o 00| ||eng c
024 7 |a 10.1002/adma.202302979  |2 doi 
028 5 2 |a pubmed24n1195.xml 
035 |a (DE-627)NLM358799481 
035 |a (NLM)37378645 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Tsai, Jing-Yuan  |e verfasserin  |4 aut 
245 1 2 |a A High-Entropy-Oxides-Based Memristor  |b Outstanding Resistive Switching Performance and Mechanisms in Atomic Structural Evolution 
264 1 |c 2023 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Revised 20.10.2023 
500 |a published: Print-Electronic 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a © 2023 Wiley-VCH GmbH. 
520 |a The application of high-entropy oxide (HEO) has attracted significant attention in recent years owing to their unique structural characteristics, such as excellent electrochemical properties and long-term cycling stability. However, the application of resistive random-access memory (RRAM) has not been extensively studied, and the switching mechanism of HEO-based RRAM has yet to be thoroughly investigated. In this study, HEO (Cr, Mn, Fe, Co, Ni)3 O4 with a spinel structure is epitaxially grown on a Nb:STO conductive substrate, and Pt metal is deposited as the top electrode. After the resistive-switching operation, some regions of the spinel structure are transformed into a rock-salt structure and analyzed using advanced transmission electron microscopy and scanning transmission electron microscopy. From the results of X-ray photoelectron spectroscopy and electron energy loss spectroscopy, only specific elements would change their valence state, which results in excellent resistive-switching properties with a high on/off ratio on the order of 105 , outstanding endurance (>4550 cycles), long retention time (>104 s), and high stability, which suggests that HEO is a promising RRAM material 
650 4 |a Journal Article 
650 4 |a atomic-scale evolution 
650 4 |a high-entropy oxide 
650 4 |a resistive random-access memory 
650 4 |a resistive switching 
650 4 |a structural transformation 
700 1 |a Chen, Jui-Yuan  |e verfasserin  |4 aut 
700 1 |a Huang, Chun-Wei  |e verfasserin  |4 aut 
700 1 |a Lo, Hung-Yang  |e verfasserin  |4 aut 
700 1 |a Ke, Wei-En  |e verfasserin  |4 aut 
700 1 |a Chu, Ying-Hao  |e verfasserin  |4 aut 
700 1 |a Wu, Wen-Wei  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Advanced materials (Deerfield Beach, Fla.)  |d 1998  |g 35(2023), 41 vom: 13. Okt., Seite e2302979  |w (DE-627)NLM098206397  |x 1521-4095  |7 nnns 
773 1 8 |g volume:35  |g year:2023  |g number:41  |g day:13  |g month:10  |g pages:e2302979 
856 4 0 |u http://dx.doi.org/10.1002/adma.202302979  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 35  |j 2023  |e 41  |b 13  |c 10  |h e2302979