Rendering Thin Transparent Layers with Extended Normal Distribution Functions

Realistic Rendering of thin transparent layers bounded by rough surfaces involves substantial expense of computation time to account for multiple internal reflections. Resorting to Monte Carlo rendering for such material is usually impractical since recursive importance sampling is inevitable. To re...

Ausführliche Beschreibung

Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on visualization and computer graphics. - 1996. - 23(2017), 9 vom: 15. Sept., Seite 2108-2119
1. Verfasser: Guo, Jie (VerfasserIn)
Weitere Verfasser: Qian, Jinghui, Guo, Yanwen, Pan, Jingui
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2017
Zugriff auf das übergeordnete Werk:IEEE transactions on visualization and computer graphics
Schlagworte:Journal Article Research Support, Non-U.S. Gov't
LEADER 01000naa a22002652 4500
001 NLM268249997
003 DE-627
005 20231224222315.0
007 cr uuu---uuuuu
008 231224s2017 xx |||||o 00| ||eng c
024 7 |a 10.1109/TVCG.2016.2617872  |2 doi 
028 5 2 |a pubmed24n0894.xml 
035 |a (DE-627)NLM268249997 
035 |a (NLM)28113400 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Guo, Jie  |e verfasserin  |4 aut 
245 1 0 |a Rendering Thin Transparent Layers with Extended Normal Distribution Functions 
264 1 |c 2017 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Completed 15.11.2018 
500 |a Date Revised 15.11.2018 
500 |a published: Print-Electronic 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a Realistic Rendering of thin transparent layers bounded by rough surfaces involves substantial expense of computation time to account for multiple internal reflections. Resorting to Monte Carlo rendering for such material is usually impractical since recursive importance sampling is inevitable. To reduce the burden of sampling for simulating subsurface scattering and hence improve rendering performance, we adapt the microfacet model to the material with a single thin layer by introducing the extended normal distribution function (ENDF), a new representation of this model, to express visually perceived roughness due to multiple bounces of reflections and refractions. With such a representation, both surface reflection and subsurface scattering can be treated in the same microfacet framework, and the sampling process can be reduced to only once for each bounce of scattering. We derive analytical expressions of the ENDF for several cases using joint spherical warping. We also show how to choose proper shadowing-masking and Fresnel terms to make the proposed bidirectional scattering distribution function (BSDF) model energy-conserving. Experiments demonstrate that our model can be easily incorporated into a Monte Carlo path tracer with little extra computational and storage overhead, enabling some real-time applications 
650 4 |a Journal Article 
650 4 |a Research Support, Non-U.S. Gov't 
700 1 |a Qian, Jinghui  |e verfasserin  |4 aut 
700 1 |a Guo, Yanwen  |e verfasserin  |4 aut 
700 1 |a Pan, Jingui  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t IEEE transactions on visualization and computer graphics  |d 1996  |g 23(2017), 9 vom: 15. Sept., Seite 2108-2119  |w (DE-627)NLM098269445  |x 1941-0506  |7 nnns 
773 1 8 |g volume:23  |g year:2017  |g number:9  |g day:15  |g month:09  |g pages:2108-2119 
856 4 0 |u http://dx.doi.org/10.1109/TVCG.2016.2617872  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 23  |j 2017  |e 9  |b 15  |c 09  |h 2108-2119