Rendering Thin Transparent Layers with Extended Normal Distribution Functions

Realistic Rendering of thin transparent layers bounded by rough surfaces involves substantial expense of computation time to account for multiple internal reflections. Resorting to Monte Carlo rendering for such material is usually impractical since recursive importance sampling is inevitable. To re...

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on visualization and computer graphics. - 1996. - 23(2017), 9 vom: 15. Sept., Seite 2108-2119
1. Verfasser: Guo, Jie (VerfasserIn)
Weitere Verfasser: Qian, Jinghui, Guo, Yanwen, Pan, Jingui
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2017
Zugriff auf das übergeordnete Werk:IEEE transactions on visualization and computer graphics
Schlagworte:Journal Article Research Support, Non-U.S. Gov't
Beschreibung
Zusammenfassung:Realistic Rendering of thin transparent layers bounded by rough surfaces involves substantial expense of computation time to account for multiple internal reflections. Resorting to Monte Carlo rendering for such material is usually impractical since recursive importance sampling is inevitable. To reduce the burden of sampling for simulating subsurface scattering and hence improve rendering performance, we adapt the microfacet model to the material with a single thin layer by introducing the extended normal distribution function (ENDF), a new representation of this model, to express visually perceived roughness due to multiple bounces of reflections and refractions. With such a representation, both surface reflection and subsurface scattering can be treated in the same microfacet framework, and the sampling process can be reduced to only once for each bounce of scattering. We derive analytical expressions of the ENDF for several cases using joint spherical warping. We also show how to choose proper shadowing-masking and Fresnel terms to make the proposed bidirectional scattering distribution function (BSDF) model energy-conserving. Experiments demonstrate that our model can be easily incorporated into a Monte Carlo path tracer with little extra computational and storage overhead, enabling some real-time applications
Beschreibung:Date Completed 15.11.2018
Date Revised 15.11.2018
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1941-0506
DOI:10.1109/TVCG.2016.2617872