Surface modification of a polyimide gate insulator with an yttrium oxide interlayer for aqueous-solution-processed ZnO thin-film transistors

We report a simple approach to modify the surface of a polyimide gate insulator with an yttrium oxide interlayer for aqueous-solution-processed ZnO thin-film transistors. It is expected that the yttrium oxide interlayer will provide a surface that is more chemically compatible with the ZnO semicondu...

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Bibliographische Detailangaben
Veröffentlicht in:Langmuir : the ACS journal of surfaces and colloids. - 1992. - 29(2013), 23 vom: 11. Juni, Seite 7143-50
1. Verfasser: Jang, Kwang-Suk (VerfasserIn)
Weitere Verfasser: Wee, Duyoung, Kim, Yun Ho, Kim, Jinsoo, Ahn, Taek, Ka, Jae-Won, Yi, Mi Hye
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2013
Zugriff auf das übergeordnete Werk:Langmuir : the ACS journal of surfaces and colloids
Schlagworte:Journal Article Research Support, Non-U.S. Gov't Resins, Synthetic Solutions Water 059QF0KO0R polyimide resin 39355-34-5 Yttrium 58784XQC3Y mehr... Zinc Oxide SOI2LOH54Z yttria X8071685XT
Beschreibung
Zusammenfassung:We report a simple approach to modify the surface of a polyimide gate insulator with an yttrium oxide interlayer for aqueous-solution-processed ZnO thin-film transistors. It is expected that the yttrium oxide interlayer will provide a surface that is more chemically compatible with the ZnO semiconductor than is bare polyimde. The field-effect mobility and the on/off current ratio of the ZnO TFT with the YOx/polyimide gate insulator were 0.456 cm(2)/V·s and 2.12 × 10(6), respectively, whereas the ZnO TFT with the polyimide gate insulator was inactive
Beschreibung:Date Completed 10.01.2014
Date Revised 25.11.2016
published: Print-Electronic
Citation Status MEDLINE
ISSN:1520-5827
DOI:10.1021/la401356u