Engineering Atomic-Scale Patterning and Resistive Switching in 2D Crystals and Application in Image Processing

© 2023 Wiley-VCH GmbH.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 35(2023), 51 vom: 09. Dez., Seite e2306850
1. Verfasser: Yin, Lei (VerfasserIn)
Weitere Verfasser: Cheng, Ruiqing, Pan, Shurong, Xiong, Wenqi, Chang, Sheng, Zhai, Baoxing, Wen, Yao, Cai, Yuchen, Guo, Yuzheng, Sendeku, Marshet Getaye, Jiang, Jian, Liao, Weitu, Wang, Zhenxing, He, Jun
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2023
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article 2D crystals atomic-scale patterning cuprous telluride image processing resistive switching
Beschreibung
Zusammenfassung:© 2023 Wiley-VCH GmbH.
The ultrathin thickness of 2D layered materials affords the control of their properties through defects, surface modification, and electrostatic fields more efficiently compared with bulk architecture. In particular, patterning design, such as moiré superlattice patterns and spatially periodic dielectric structures, are demonstrated to possess the ability to precisely control the local atomic and electronic environment at large scale, thus providing extra degrees of freedom to realize tailored material properties and device functionality. Here, the scalable atomic-scale patterning in superionic cuprous telluride by using the bonding difference at nonequivalent copper sites is reported. Moreover, benefitting from the natural coupling of ordered and disordered sublattices, controllable piezoelectricity-like multilevel switching and bipolar switching with the designed crystal structure and electrical contact is realized, and their application in image enhancement is demonstrated. This work extends the known classes of patternable crystals and atomic switching devices, and ushers in a frontier for image processing with memristors
Beschreibung:Date Revised 21.12.2023
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1521-4095
DOI:10.1002/adma.202306850