Faster and lower-dose X-ray reflectivity measurements enabled by physics-informed modeling and artificial intelligence co-refinement

© David Mareček et al. 2022.

Bibliographische Detailangaben
Veröffentlicht in:Journal of applied crystallography. - 1998. - 55(2022), Pt 5 vom: 01. Okt., Seite 1305-1313
1. Verfasser: Mareček, David (VerfasserIn)
Weitere Verfasser: Oberreiter, Julian, Nelson, Andrew, Kowarik, Stefan
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2022
Zugriff auf das übergeordnete Werk:Journal of applied crystallography
Schlagworte:Journal Article X-ray reflectivity co-refinement in situ measurement neural networks neutron reflectivity
Beschreibung
Zusammenfassung:© David Mareček et al. 2022.
An approach is presented for analysis of real-time X-ray reflectivity (XRR) process data not just as a function of the magnitude of the reciprocal-space vector q, as is commonly done, but as a function of both q and time. The real-space structures extracted from the XRR curves are restricted to be solutions of a physics-informed growth model and use state-of-the-art convolutional neural networks (CNNs) and differential evolution fitting to co-refine multiple time-dependent XRR curves R(q, t) of a thin film growth experiment. Thereby it becomes possible to correctly analyze XRR data with a fidelity corresponding to standard fits of individual XRR curves, even if they are sparsely sampled, with a sevenfold reduction of XRR data points, or if the data are noisy due to a 200-fold reduction in counting times. The approach of using a CNN analysis and of including prior information through a kinetic model is not limited to growth studies but can be easily extended to other kinetic X-ray or neutron reflectivity data to enable faster measurements with less beam damage
Beschreibung:Date Revised 19.10.2022
published: Electronic-eCollection
Citation Status PubMed-not-MEDLINE
ISSN:0021-8898
DOI:10.1107/S2053273322008051