Theoretical investigations on the defect structures and g factors for V4+ in 30PbO-5Bi2 O3 -(65-x)SiO2 glasses at different concentrations

Theoretical investigations on the defect structures and g factors for V4+ in 30PbO-5Bi2 O3 -(65-x)SiO2 glasses at different concentrations

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Détails bibliographiques
Publié dans:Magnetic resonance in chemistry : MRC. - 1985. - 60(2022), 8 vom: 02. Aug., Seite 836-844
Auteur principal: Hu, Jian-Guo (Auteur)
Autres auteurs: Wu, Shao-Yi, Yan, Li, Wei, Zhang-Ting, Yang, Yi, Wu, Hao, Zhu, Qin-Sheng
Format: Article en ligne
Langue:English
Publié: 2022
Accès à la collection:Magnetic resonance in chemistry : MRC
Sujets:Journal Article Research Support, Non-U.S. Gov't 30PbO-5Bi2O3-(65-x) SiO2 (PBS) glasses V4 + defect structures electron paramagnetic resonance (EPR) Silicon Dioxide 7631-86-9
Accès en ligne Volltext