Controlled Silicidation of Silicon Nanowires Using Flash Lamp Annealing

Among other new device concepts, nickel silicide (NiSix)-based Schottky barrier nanowire transistors are projected to supplement down-scaling of the complementary metal-oxide semiconductor (CMOS) technology as its physical limits are reached. Control over the NiSix phase and its intrusions into the...

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Veröffentlicht in:Langmuir : the ACS journal of surfaces and colloids. - 1999. - 37(2021), 49 vom: 14. Dez., Seite 14284-14291
1. Verfasser: Khan, Muhammad Bilal (VerfasserIn)
Weitere Verfasser: Prucnal, Slawomir, Ghosh, Sayantan, Deb, Dipjyoti, Hübner, René, Pohl, Darius, Rebohle, Lars, Mikolajick, Thomas, Erbe, Artur, Georgiev, Yordan M
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2021
Zugriff auf das übergeordnete Werk:Langmuir : the ACS journal of surfaces and colloids
Schlagworte:Journal Article
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245 1 0 |a Controlled Silicidation of Silicon Nanowires Using Flash Lamp Annealing 
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520 |a Among other new device concepts, nickel silicide (NiSix)-based Schottky barrier nanowire transistors are projected to supplement down-scaling of the complementary metal-oxide semiconductor (CMOS) technology as its physical limits are reached. Control over the NiSix phase and its intrusions into the nanowire is essential for superior performance and down-scaling of these devices. Several works have shown control over the phase, but control over the intrusion lengths has remained a challenge. To overcome this, we report a novel millisecond-range flash lamp annealing (FLA)-based silicidation process. Nanowires are fabricated on silicon-on-insulator substrates using a top-down approach. Subsequently, Ni silicidation experiments are carried out using FLA. It is demonstrated that this silicidation process gives unprecedented control over the silicide intrusions. Scanning electron microscopy and high-resolution transmission electron microscopy are performed for structural characterization of the silicide. FLA temperatures are estimated with the help of simulations 
650 4 |a Journal Article 
700 1 |a Prucnal, Slawomir  |e verfasserin  |4 aut 
700 1 |a Ghosh, Sayantan  |e verfasserin  |4 aut 
700 1 |a Deb, Dipjyoti  |e verfasserin  |4 aut 
700 1 |a Hübner, René  |e verfasserin  |4 aut 
700 1 |a Pohl, Darius  |e verfasserin  |4 aut 
700 1 |a Rebohle, Lars  |e verfasserin  |4 aut 
700 1 |a Mikolajick, Thomas  |e verfasserin  |4 aut 
700 1 |a Erbe, Artur  |e verfasserin  |4 aut 
700 1 |a Georgiev, Yordan M  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Langmuir : the ACS journal of surfaces and colloids  |d 1999  |g 37(2021), 49 vom: 14. Dez., Seite 14284-14291  |w (DE-627)NLM098181009  |x 1520-5827  |7 nnns 
773 1 8 |g volume:37  |g year:2021  |g number:49  |g day:14  |g month:12  |g pages:14284-14291 
856 4 0 |u http://dx.doi.org/10.1021/acs.langmuir.1c01862  |3 Volltext 
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