|
|
|
|
LEADER |
01000naa a22002652 4500 |
001 |
NLM32759568X |
003 |
DE-627 |
005 |
20231225201128.0 |
007 |
cr uuu---uuuuu |
008 |
231225s2021 xx |||||o 00| ||eng c |
024 |
7 |
|
|a 10.1107/S1600577521004835
|2 doi
|
028 |
5 |
2 |
|a pubmed24n1091.xml
|
035 |
|
|
|a (DE-627)NLM32759568X
|
035 |
|
|
|a (NLM)34212871
|
040 |
|
|
|a DE-627
|b ger
|c DE-627
|e rakwb
|
041 |
|
|
|a eng
|
100 |
1 |
|
|a Scott, Christopher C
|e verfasserin
|4 aut
|
245 |
1 |
0 |
|a High-energy micrometre-scale pixel direct conversion X-ray detector
|
264 |
|
1 |
|c 2021
|
336 |
|
|
|a Text
|b txt
|2 rdacontent
|
337 |
|
|
|a ƒaComputermedien
|b c
|2 rdamedia
|
338 |
|
|
|a ƒa Online-Ressource
|b cr
|2 rdacarrier
|
500 |
|
|
|a Date Revised 02.07.2021
|
500 |
|
|
|a published: Print-Electronic
|
500 |
|
|
|a Citation Status PubMed-not-MEDLINE
|
520 |
|
|
|a The objective of this work was to fabricate and characterize a new X-ray imaging detector with micrometre-scale pixel dimensions (7.8 µm) and high detection efficiency for hard X-ray energies above 20 keV. A key technology component consists of a monolithic hybrid detector built by direct deposition of an amorphous selenium film on a custom designed CMOS readout integrated circuit. Characterization was carried out at the synchrotron beamline 1-BM-B at the Advanced Photon Source of Argonne National Laboratory. The direct conversion detector demonstrated micrometre-scale spatial resolution with a 63 keV modulation transfer function of 10% at Nyquist frequency. In addition, spatial resolving power down to 8 µm was determined by imaging a transmission bar target at 21 keV. X-ray signal linearity, responsivity and lag were also characterized in the same energy range. Finally, phase contrast edge enhancement was observed in a phase object placed in the beam path. This amorphous selenium/CMOS detector technology can address gaps in commercially available X-ray detectors which limit their usefulness for existing synchrotron applications at energies greater than 50 keV; for example, phase contrast tomography and high-resolution imaging of nanoscale lattice distortions in bulk crystalline materials using Bragg coherent diffraction imaging. The technology will also facilitate the creation of novel synchrotron imaging applications for X-ray energies at or above 20 keV
|
650 |
|
4 |
|a Journal Article
|
650 |
|
4 |
|a amorphous selenium
|
650 |
|
4 |
|a high-energy X-ray detector
|
650 |
|
4 |
|a micrometre-scale spatial resolution
|
700 |
1 |
|
|a Farrier, Michael
|e verfasserin
|4 aut
|
700 |
1 |
|
|a Li, Yunzhe
|e verfasserin
|4 aut
|
700 |
1 |
|
|a Laxer, Sam
|e verfasserin
|4 aut
|
700 |
1 |
|
|a Ravi, Parmesh
|e verfasserin
|4 aut
|
700 |
1 |
|
|a Kenesei, Peter
|e verfasserin
|4 aut
|
700 |
1 |
|
|a Wojcik, Michael J
|e verfasserin
|4 aut
|
700 |
1 |
|
|a Miceli, Antonino
|e verfasserin
|4 aut
|
700 |
1 |
|
|a Karim, Karim S
|e verfasserin
|4 aut
|
773 |
0 |
8 |
|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 28(2021), Pt 4 vom: 01. Juli, Seite 1081-1089
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnns
|
773 |
1 |
8 |
|g volume:28
|g year:2021
|g number:Pt 4
|g day:01
|g month:07
|g pages:1081-1089
|
856 |
4 |
0 |
|u http://dx.doi.org/10.1107/S1600577521004835
|3 Volltext
|
912 |
|
|
|a GBV_USEFLAG_A
|
912 |
|
|
|a SYSFLAG_A
|
912 |
|
|
|a GBV_NLM
|
912 |
|
|
|a GBV_ILN_40
|
912 |
|
|
|a GBV_ILN_350
|
912 |
|
|
|a GBV_ILN_2005
|
951 |
|
|
|a AR
|
952 |
|
|
|d 28
|j 2021
|e Pt 4
|b 01
|c 07
|h 1081-1089
|