High-energy micrometre-scale pixel direct conversion X-ray detector

The objective of this work was to fabricate and characterize a new X-ray imaging detector with micrometre-scale pixel dimensions (7.8 µm) and high detection efficiency for hard X-ray energies above 20 keV. A key technology component consists of a monolithic hybrid detector built by direct deposition...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 28(2021), Pt 4 vom: 01. Juli, Seite 1081-1089
1. Verfasser: Scott, Christopher C (VerfasserIn)
Weitere Verfasser: Farrier, Michael, Li, Yunzhe, Laxer, Sam, Ravi, Parmesh, Kenesei, Peter, Wojcik, Michael J, Miceli, Antonino, Karim, Karim S
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2021
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article amorphous selenium high-energy X-ray detector micrometre-scale spatial resolution
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520 |a The objective of this work was to fabricate and characterize a new X-ray imaging detector with micrometre-scale pixel dimensions (7.8 µm) and high detection efficiency for hard X-ray energies above 20 keV. A key technology component consists of a monolithic hybrid detector built by direct deposition of an amorphous selenium film on a custom designed CMOS readout integrated circuit. Characterization was carried out at the synchrotron beamline 1-BM-B at the Advanced Photon Source of Argonne National Laboratory. The direct conversion detector demonstrated micrometre-scale spatial resolution with a 63 keV modulation transfer function of 10% at Nyquist frequency. In addition, spatial resolving power down to 8 µm was determined by imaging a transmission bar target at 21 keV. X-ray signal linearity, responsivity and lag were also characterized in the same energy range. Finally, phase contrast edge enhancement was observed in a phase object placed in the beam path. This amorphous selenium/CMOS detector technology can address gaps in commercially available X-ray detectors which limit their usefulness for existing synchrotron applications at energies greater than 50 keV; for example, phase contrast tomography and high-resolution imaging of nanoscale lattice distortions in bulk crystalline materials using Bragg coherent diffraction imaging. The technology will also facilitate the creation of novel synchrotron imaging applications for X-ray energies at or above 20 keV 
650 4 |a Journal Article 
650 4 |a amorphous selenium 
650 4 |a high-energy X-ray detector 
650 4 |a micrometre-scale spatial resolution 
700 1 |a Farrier, Michael  |e verfasserin  |4 aut 
700 1 |a Li, Yunzhe  |e verfasserin  |4 aut 
700 1 |a Laxer, Sam  |e verfasserin  |4 aut 
700 1 |a Ravi, Parmesh  |e verfasserin  |4 aut 
700 1 |a Kenesei, Peter  |e verfasserin  |4 aut 
700 1 |a Wojcik, Michael J  |e verfasserin  |4 aut 
700 1 |a Miceli, Antonino  |e verfasserin  |4 aut 
700 1 |a Karim, Karim S  |e verfasserin  |4 aut 
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