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231225s2020 xx |||||o 00| ||eng c |
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|a 10.1107/S1600577519014188
|2 doi
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|a pubmed25n1015.xml
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|a (NLM)31868739
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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|a Svechnikov, Mikhail
|e verfasserin
|4 aut
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|a Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4-250 eV
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|c 2020
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
|b c
|2 rdamedia
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|a ƒa Online-Ressource
|b cr
|2 rdacarrier
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|a Date Completed 30.12.2019
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|a Date Revised 30.12.2019
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a In this work, the refractive index of beryllium in the photon energy range 20.4-250 eV was experimentally determined. The initial data include measurements of the transmittance of two free-standing Be films with thicknesses of 70 nm and 152 nm, as well as reflectometric measurements of similar films on a substrate. Measurements were carried out at the optics beamline of the BESSY II synchrotron radiation source. The absorption coefficient β was found directly from the transmission coefficient of the films, and the real part of the polarizability δ was calculated from the Kramers-Kronig relations. A comparison is carried out with results obtained 20 years ago at the ALS synchrotron using a similar methodology
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|a Journal Article
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|a beryllium
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|a free-standing thin film
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|a near-edge X-ray absorption fine-structure spectroscopy
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|a optical constants
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|a photoabsorption
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|a refractive index
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|a Chkhalo, Nikolay
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Lopatin, Alexey
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Pleshkov, Roman
|e verfasserin
|4 aut
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1 |
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|a Polkovnikov, Vladimir
|e verfasserin
|4 aut
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1 |
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|a Salashchenko, Nikolay
|e verfasserin
|4 aut
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1 |
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|a Schäfers, Franz
|e verfasserin
|4 aut
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1 |
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|a Sertsu, Mewael G
|e verfasserin
|4 aut
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|a Sokolov, Andrey
|e verfasserin
|4 aut
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| 700 |
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|a Tsybin, Nikolay
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 27(2020), Pt 1 vom: 01. Jan., Seite 75-82
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnas
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| 773 |
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|g volume:27
|g year:2020
|g number:Pt 1
|g day:01
|g month:01
|g pages:75-82
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|u http://dx.doi.org/10.1107/S1600577519014188
|3 Volltext
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|d 27
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|e Pt 1
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|h 75-82
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