Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4-250 eV
In this work, the refractive index of beryllium in the photon energy range 20.4-250 eV was experimentally determined. The initial data include measurements of the transmittance of two free-standing Be films with thicknesses of 70 nm and 152 nm, as well as reflectometric measurements of similar films...
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Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 27(2020), Pt 1 vom: 01. Jan., Seite 75-82
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| 1. Verfasser: |
Svechnikov, Mikhail
(VerfasserIn) |
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| Weitere Verfasser: |
Chkhalo, Nikolay,
Lopatin, Alexey,
Pleshkov, Roman,
Polkovnikov, Vladimir,
Salashchenko, Nikolay,
Schäfers, Franz,
Sertsu, Mewael G,
Sokolov, Andrey,
Tsybin, Nikolay |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2020
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
beryllium
free-standing thin film
near-edge X-ray absorption fine-structure spectroscopy
optical constants
photoabsorption
refractive index |
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