A large parallax-free gas diffraction meter based on a thinner-THGEM (thick gaseous electron multiplier) has been developed at the Beijing Synchrotron Radiation Facility (BSRF). A thinner-THGEM of thickness 200 µm is adopted, which can be shaped into a curve to eliminate parallax-error effects. The...
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 26(2019), Pt 1 vom: 01. Jan., Seite 83-88
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| 1. Verfasser: |
Chen, Shi
(VerfasserIn) |
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| Weitere Verfasser: |
Liu, Hongbang,
Liu, Qian,
Zheng, Yangheng,
Wang, Binglong,
Huang, Wenqian,
Dong, Yang,
Rong, Yu,
Jiao, Xinda,
Guan, Yu,
Wang, Jing,
Li, Min,
Liu, Jizhou,
Zhang, Mengmeng |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2019
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
BSRF
X-ray diffraction
micropattern gaseous detectors
thinner-THGEM |
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