One-dimensional parallax-free position-sensitive detector for diffraction measurements based on a home-made thin THGEM

A large parallax-free gas diffraction meter based on a thinner-THGEM (thick gaseous electron multiplier) has been developed at the Beijing Synchrotron Radiation Facility (BSRF). A thinner-THGEM of thickness 200 µm is adopted, which can be shaped into a curve to eliminate parallax-error effects. The...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 26(2019), Pt 1 vom: 01. Jan., Seite 83-88
1. Verfasser: Chen, Shi (VerfasserIn)
Weitere Verfasser: Liu, Hongbang, Liu, Qian, Zheng, Yangheng, Wang, Binglong, Huang, Wenqian, Dong, Yang, Rong, Yu, Jiao, Xinda, Guan, Yu, Wang, Jing, Li, Min, Liu, Jizhou, Zhang, Mengmeng
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2019
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article BSRF X-ray diffraction micropattern gaseous detectors thinner-THGEM
Beschreibung
Zusammenfassung:A large parallax-free gas diffraction meter based on a thinner-THGEM (thick gaseous electron multiplier) has been developed at the Beijing Synchrotron Radiation Facility (BSRF). A thinner-THGEM of thickness 200 µm is adopted, which can be shaped into a curve to eliminate parallax-error effects. The detector is designed to have a 48° open angle positioned 20 cm from the powder samples. A front-end electronics board with 128 channels direct-current mode was adapted for the 8 keV BSRF beamline with 0.2 ns/100 ns stable duty cycle. Two powder samples, TiO2 and SnO2, were tested separately. The measured spectra with an angular resolution of 0.148 ± 0.081° are consistent with the data from the powder diffraction file. Combining the gas gain of the thinner-THGEM with the electronic circuit dynamic range, a very broad dynamic range of about 107 could be obtained
Beschreibung:Date Completed 30.01.2019
Date Revised 30.01.2019
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775
DOI:10.1107/S160057751801086X