Investigation of the Internal Chemical Composition of Chitosan-Based LbL Films by Depth-Profiling X-ray Photoelectron Spectroscopy (XPS) Analysis
Chitosan-based thin films were assembled using the layer-by-layer technique, and the axial composition was accessed using X-ray photoelectron spectroscopy with depth profiling. Chitosan (CHI) samples possessing different degrees of acetylation ([Formula: see text]) and molecular weight ([Formula: se...
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Détails bibliographiques
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 34(2018), 4 vom: 30. Jan., Seite 1429-1440
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| Auteur principal: |
Taketa, Thiago B
(Auteur) |
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| Autres auteurs: |
Dos Santos, Danilo M,
Fiamingo, Anderson,
Vaz, Juliana M,
Beppu, Marisa M,
Campana-Filho, Sérgio P,
Cohen, Robert E,
Rubner, Michael F |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2018
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids
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| Sujets: | Journal Article
Research Support, Non-U.S. Gov't
Research Support, U.S. Gov't, Non-P.H.S. |
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