APA Zitierstil

Taketa, T. B., Dos Santos, D. M., Fiamingo, A., Vaz, J. M., Beppu, M. M., Campana-Filho, S. P., . . . Rubner, M. F. (2018). Investigation of the Internal Chemical Composition of Chitosan-Based LbL Films by Depth-Profiling X-ray Photoelectron Spectroscopy (XPS) Analysis. Langmuir : the ACS journal of surfaces and colloids, 34(4), 1429. https://doi.org/10.1021/acs.langmuir.7b04104

Chicago Zitierstil

Taketa, Thiago B., Danilo M. Dos Santos, Anderson Fiamingo, Juliana M. Vaz, Marisa M. Beppu, Sérgio P. Campana-Filho, Robert E. Cohen, und Michael F. Rubner. "Investigation of the Internal Chemical Composition of Chitosan-Based LbL Films by Depth-Profiling X-ray Photoelectron Spectroscopy (XPS) Analysis." Langmuir : The ACS Journal of Surfaces and Colloids 34, no. 4 (2018): 1429. https://dx.doi.org/10.1021/acs.langmuir.7b04104.

MLA Zitierstil

Taketa, Thiago B., et al. "Investigation of the Internal Chemical Composition of Chitosan-Based LbL Films by Depth-Profiling X-ray Photoelectron Spectroscopy (XPS) Analysis." Langmuir : The ACS Journal of Surfaces and Colloids, vol. 34, no. 4, 2018, p. 1429.