Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy

The presence of native oxide on the surface of silicon nanoparticles is known to inhibit charge transport on the surfaces. Scanning electron microscopy (SEM) studies reveal that the particles in the printed silicon network have a wide range of sizes and shapes. High-resolution transmission electron...

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Veröffentlicht in:	Journal of synchrotron radiation. - 1994. - 24(2017), Pt 5 vom: 01. Sept., Seite 1017-1023
1. Verfasser:	Unuigbe, David M (VerfasserIn)
Weitere Verfasser:	Harting, Margit, Jonah, Emmanuel O, Britton, David T, Nordlund, Dennis
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	2017
Zugriff auf das übergeordnete Werk:	Journal of synchrotron radiation
Schlagworte:	Journal Article SEM XANES XPS charge transport native oxide network structures printed layers sub-oxide states