Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector
The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using a tunable X-ray source. This article reports on a novel experimental procedu...
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| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 50(2017), Pt 3 vom: 01. Juni, Seite 901-908
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| 1. Verfasser: |
Abboud, A
(VerfasserIn) |
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| Weitere Verfasser: |
Kirchlechner, C,
Keckes, J,
Conka Nurdan, T,
Send, S,
Micha, J S,
Ulrich, O,
Hartmann, R,
Strüder, L,
Pietsch, U |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2017
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography
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| Schlagworte: | Journal Article
energy-dispersive X-ray detectors
microbeam X-ray Laue diffraction
strain |
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