Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

von Abboud, A
Veröffentlicht in: Journal of applied crystallography (2017)

X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via

von Todt, J
Veröffentlicht in: Journal of applied crystallography (2016)

Combinatorial refinement of thin-film microstructure, properties and process conditions iterative nanoscale search for self-assembled TiAlN nanolamellae

von Zalesak, J
Veröffentlicht in: Journal of applied crystallography (2016)

Elastic constants of fibre-textured thin films determined by X-ray diffraction

von Martinschitz, K J
Veröffentlicht in: Journal of applied crystallography (2009)