Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using a tunable X-ray source. This article reports on a novel experimental procedu...

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Veröffentlicht in:Journal of applied crystallography. - 1998. - 50(2017), Pt 3 vom: 01. Juni, Seite 901-908
1. Verfasser: Abboud, A (VerfasserIn)
Weitere Verfasser: Kirchlechner, C, Keckes, J, Conka Nurdan, T, Send, S, Micha, J S, Ulrich, O, Hartmann, R, Strüder, L, Pietsch, U
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2017
Zugriff auf das übergeordnete Werk:Journal of applied crystallography
Schlagworte:Journal Article energy-dispersive X-ray detectors microbeam X-ray Laue diffraction strain
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520 |a The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using a tunable X-ray source. This article reports on a novel experimental procedure for single-shot full strain tensor determination using polychromatic synchrotron radiation with an energy range from 5 to 23 keV. Microbeam X-ray Laue diffraction patterns were collected from a copper micro-bending beam along the central axis (centroid of the cross section). Taking advantage of a two-dimensional energy-dispersive X-ray detector (pnCCD), the position and energy of the collected Laue spots were measured for multiple positions on the sample, allowing the measurement of variations in the local microstructure. At the same time, both the deviatoric and hydrostatic components of the elastic strain and stress tensors were calculated 
650 4 |a Journal Article 
650 4 |a energy-dispersive X-ray detectors 
650 4 |a microbeam X-ray Laue diffraction 
650 4 |a strain 
700 1 |a Kirchlechner, C  |e verfasserin  |4 aut 
700 1 |a Keckes, J  |e verfasserin  |4 aut 
700 1 |a Conka Nurdan, T  |e verfasserin  |4 aut 
700 1 |a Send, S  |e verfasserin  |4 aut 
700 1 |a Micha, J S  |e verfasserin  |4 aut 
700 1 |a Ulrich, O  |e verfasserin  |4 aut 
700 1 |a Hartmann, R  |e verfasserin  |4 aut 
700 1 |a Strüder, L  |e verfasserin  |4 aut 
700 1 |a Pietsch, U  |e verfasserin  |4 aut 
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