Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

The twin distribution in topological insulators Bi2Te3 and Bi2Se3 was imaged by electron backscatter diffraction (EBSD) and scanning X-ray diffraction microscopy (SXRM). The crystal orientation at the surface, determined by EBSD, is correlated with the surface topography, which shows triangular pyra...

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Veröffentlicht in:	Journal of applied crystallography. - 1998. - 50(2017), Pt 2 vom: 01. Apr., Seite 369-377
1. Verfasser:	Kriegner, Dominik (VerfasserIn)
Weitere Verfasser:	Harcuba, Petr, Veselý, Jozef, Lesnik, Andreas, Bauer, Guenther, Springholz, Gunther, Holý, Václav
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	2017
Zugriff auf das übergeordnete Werk:	Journal of applied crystallography
Schlagworte:	Journal Article electron backscatter diffraction scanning X-ray diffraction topological insulators twinning