A Supercritical Lens Optical Label-Free Microscopy Sub-Diffraction Resolution and Ultra-Long Working Distance

A Supercritical Lens Optical Label-Free Microscopy : Sub-Diffraction Resolution and Ultra-Long Working Distance

© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 29(2017), 8 vom: 21. Feb.
1. Verfasser: Qin, Fei (VerfasserIn)
Weitere Verfasser: Huang, Kun, Wu, Jianfeng, Teng, Jinghua, Qiu, Cheng-Wei, Hong, Minghui
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2017
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article far-field label-free optical imaging planar lens super-resolution
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520 |a A planar metalens for achieving super-resolution imaging in far-field is proposed. This metalens, which has a non-sub-wavelength feature size, can be fabricated by conventional laser pattern generator. The imaging process is purely physical and captured in real time, without any pre- and post-processing 
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700 1 |a Wu, Jianfeng  |e verfasserin  |4 aut 
700 1 |a Teng, Jinghua  |e verfasserin  |4 aut 
700 1 |a Qiu, Cheng-Wei  |e verfasserin  |4 aut 
700 1 |a Hong, Minghui  |e verfasserin  |4 aut 
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