A Supercritical Lens Optical Label-Free Microscopy Sub-Diffraction Resolution and Ultra-Long Working Distance

A Supercritical Lens Optical Label-Free Microscopy : Sub-Diffraction Resolution and Ultra-Long Working Distance

© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 29(2017), 8 vom: 21. Feb.
1. Verfasser: Qin, Fei (VerfasserIn)
Weitere Verfasser: Huang, Kun, Wu, Jianfeng, Teng, Jinghua, Qiu, Cheng-Wei, Hong, Minghui
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2017
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article far-field label-free optical imaging planar lens super-resolution
Beschreibung
Zusammenfassung:© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
A planar metalens for achieving super-resolution imaging in far-field is proposed. This metalens, which has a non-sub-wavelength feature size, can be fabricated by conventional laser pattern generator. The imaging process is purely physical and captured in real time, without any pre- and post-processing
Beschreibung:Date Completed 18.07.2018
Date Revised 30.09.2020
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1521-4095
DOI:10.1002/adma.201602721