Resistive Switching in All-Oxide Ferroelectric Tunnel Junctions with Ionic Interfaces

© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 28(2016), 32 vom: 13. Aug., Seite 6852-9
1. Verfasser: Qin, Qi Hang (VerfasserIn)
Weitere Verfasser: Äkäslompolo, Laura, Tuomisto, Noora, Yao, Lide, Majumdar, Sayani, Vijayakumar, Jaianth, Casiraghi, Arianna, Inkinen, Sampo, Chen, Binbin, Zugarramurdi, Asier, Puska, Martti, van Dijken, Sebastiaan
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2016
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article Tsu-Esaki tunneling current formula ferroelectric tunnel junctions oxygen vacancy migration resistive switching transition metal oxides
LEADER 01000naa a22002652 4500
001 NLM260947431
003 DE-627
005 20231224194505.0
007 cr uuu---uuuuu
008 231224s2016 xx |||||o 00| ||eng c
024 7 |a 10.1002/adma.201504519  |2 doi 
028 5 2 |a pubmed24n0869.xml 
035 |a (DE-627)NLM260947431 
035 |a (NLM)27248832 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Qin, Qi Hang  |e verfasserin  |4 aut 
245 1 0 |a Resistive Switching in All-Oxide Ferroelectric Tunnel Junctions with Ionic Interfaces 
264 1 |c 2016 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Completed 17.07.2018 
500 |a Date Revised 30.09.2020 
500 |a published: Print-Electronic 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a © 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. 
520 |a Universal, giant and nonvolatile resistive switching is demonstrated for oxide tunnel junctions with ferroelectric PbZr0.2 Ti0.8 O3 , ferroelectric BaTiO3, and paraelectric SrTiO3 tunnel barriers. The effects are caused by reversible migration of oxygen vacancies between the tunnel barrier and bottom La2/3 Sr1/3 MnO3 electrode. The switching process, which is driven by large electric fields, is efficient down to a temperature of 5 K 
650 4 |a Journal Article 
650 4 |a Tsu-Esaki tunneling current formula 
650 4 |a ferroelectric tunnel junctions 
650 4 |a oxygen vacancy migration 
650 4 |a resistive switching 
650 4 |a transition metal oxides 
700 1 |a Äkäslompolo, Laura  |e verfasserin  |4 aut 
700 1 |a Tuomisto, Noora  |e verfasserin  |4 aut 
700 1 |a Yao, Lide  |e verfasserin  |4 aut 
700 1 |a Majumdar, Sayani  |e verfasserin  |4 aut 
700 1 |a Vijayakumar, Jaianth  |e verfasserin  |4 aut 
700 1 |a Casiraghi, Arianna  |e verfasserin  |4 aut 
700 1 |a Inkinen, Sampo  |e verfasserin  |4 aut 
700 1 |a Chen, Binbin  |e verfasserin  |4 aut 
700 1 |a Zugarramurdi, Asier  |e verfasserin  |4 aut 
700 1 |a Puska, Martti  |e verfasserin  |4 aut 
700 1 |a van Dijken, Sebastiaan  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Advanced materials (Deerfield Beach, Fla.)  |d 1998  |g 28(2016), 32 vom: 13. Aug., Seite 6852-9  |w (DE-627)NLM098206397  |x 1521-4095  |7 nnns 
773 1 8 |g volume:28  |g year:2016  |g number:32  |g day:13  |g month:08  |g pages:6852-9 
856 4 0 |u http://dx.doi.org/10.1002/adma.201504519  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 28  |j 2016  |e 32  |b 13  |c 08  |h 6852-9