Resistive Switching in All-Oxide Ferroelectric Tunnel Junctions with Ionic Interfaces

© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 28(2016), 32 vom: 13. Aug., Seite 6852-9
1. Verfasser: Qin, Qi Hang (VerfasserIn)
Weitere Verfasser: Äkäslompolo, Laura, Tuomisto, Noora, Yao, Lide, Majumdar, Sayani, Vijayakumar, Jaianth, Casiraghi, Arianna, Inkinen, Sampo, Chen, Binbin, Zugarramurdi, Asier, Puska, Martti, van Dijken, Sebastiaan
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2016
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article Tsu-Esaki tunneling current formula ferroelectric tunnel junctions oxygen vacancy migration resistive switching transition metal oxides
Beschreibung
Zusammenfassung:© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Universal, giant and nonvolatile resistive switching is demonstrated for oxide tunnel junctions with ferroelectric PbZr0.2 Ti0.8 O3 , ferroelectric BaTiO3, and paraelectric SrTiO3 tunnel barriers. The effects are caused by reversible migration of oxygen vacancies between the tunnel barrier and bottom La2/3 Sr1/3 MnO3 electrode. The switching process, which is driven by large electric fields, is efficient down to a temperature of 5 K
Beschreibung:Date Completed 17.07.2018
Date Revised 30.09.2020
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1521-4095
DOI:10.1002/adma.201504519