Multiple scattering in grazing-incidence X-ray diffraction : impact on lattice-constant determination in thin films
Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2':6',2''-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-of-plane direction (z-direction) has been...
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Détails bibliographiques
| Publié dans: | Journal of synchrotron radiation. - 1994. - 23(2016), Pt 3 vom: 20. Mai, Seite 729-34
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| Auteur principal: |
Resel, Roland
(Auteur) |
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| Autres auteurs: |
Bainschab, Markus,
Pichler, Alexander,
Dingemans, Theo,
Simbrunner, Clemens,
Stangl, Julian,
Salzmann, Ingo |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2016
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| Accès à la collection: | Journal of synchrotron radiation
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| Sujets: | Journal Article
Research Support, Non-U.S. Gov't
X-ray refraction
X-ray scattering
grazing-incidence X-ray diffraction
grazing-incidence diffraction
organic thin films
refraction correction
surface reflection
thin films |
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