Multiple scattering in grazing-incidence X-ray diffraction : impact on lattice-constant determination in thin films

Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2':6',2''-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-of-plane direction (z-direction) has been...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 23(2016), Pt 3 vom: 20. Mai, Seite 729-34
1. Verfasser: Resel, Roland (VerfasserIn)
Weitere Verfasser: Bainschab, Markus, Pichler, Alexander, Dingemans, Theo, Simbrunner, Clemens, Stangl, Julian, Salzmann, Ingo
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2016
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Research Support, Non-U.S. Gov't X-ray refraction X-ray scattering grazing-incidence X-ray diffraction grazing-incidence diffraction organic thin films refraction correction surface reflection thin films