Multiple scattering in grazing-incidence X-ray diffraction : impact on lattice-constant determination in thin films
Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2':6',2''-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-of-plane direction (z-direction) has been...
Ausführliche Beschreibung
Bibliographische Detailangaben
Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 23(2016), Pt 3 vom: 20. Mai, Seite 729-34
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1. Verfasser: |
Resel, Roland
(VerfasserIn) |
Weitere Verfasser: |
Bainschab, Markus,
Pichler, Alexander,
Dingemans, Theo,
Simbrunner, Clemens,
Stangl, Julian,
Salzmann, Ingo |
Format: | Online-Aufsatz
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Sprache: | English |
Veröffentlicht: |
2016
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Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
X-ray refraction
X-ray scattering
grazing-incidence X-ray diffraction
grazing-incidence diffraction
organic thin films
refraction correction
surface reflection
thin films |