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231224s2016 xx |||||o 00| ||eng c |
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|a 10.1002/adma.201504188
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|a eng
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|a Wallentin, Jesper
|e verfasserin
|4 aut
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|a In Operando X-Ray Nanodiffraction Reveals Electrically Induced Bending and Lattice Contraction in a Single Nanowire Device
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|c 2016
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|a Text
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|a ƒaComputermedien
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|a ƒa Online-Ressource
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|a Date Completed 29.06.2016
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|a Date Revised 01.10.2020
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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|a Hard X-ray diffraction (XRD) using a nanofocused beam is used to measure both lattice contraction and bending in a single nanowire device under electric bias. The shape of the nanowire is reconstructed in 3D with sub-nanometer precision. As the bias voltage is gradually increased, nonreversible structural changes in the contact regions are observed, correlated with degradation of the electrical conductance
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|a Journal Article
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|a X-ray nanodiffraction
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|a lattice contraction
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|a single nanowire devices
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1 |
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|a Osterhoff, Markus
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Salditt, Tim
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Advanced materials (Deerfield Beach, Fla.)
|d 1998
|g 28(2016), 9 vom: 02. März, Seite 1788-92
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|x 1521-4095
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|g volume:28
|g year:2016
|g number:9
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|g pages:1788-92
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