Switching Kinetic of VCM-Based Memristor : Evolution and Positioning of Nanofilament

© 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 27(2015), 34 vom: 09. Sept., Seite 5028-33
1. Verfasser: Chen, Jui-Yuan (VerfasserIn)
Weitere Verfasser: Huang, Chun-Wei, Chiu, Chung-Hua, Huang, Yu-Ting, Wu, Wen-Wei
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2015
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article in situ TEM memristors nanofilaments resistive switching valence change memories (VCM)
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520 |a The filament in aAu/Ta2 O5 /Au system is analyzed and determined to be a nanoscaled TaO2-x filament. A shrunken anode localizes the filament formation and the defect boundary leads to faster accumulation of oxygen vacancies. The defect changes the switching domination between electron transport and oxygen-vacancy migration. The migration of oxygen vacancies limits the filament dynamics, indicating the crucial role played by oxygen defects 
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650 4 |a in situ TEM 
650 4 |a memristors 
650 4 |a nanofilaments 
650 4 |a resistive switching 
650 4 |a valence change memories (VCM) 
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700 1 |a Chiu, Chung-Hua  |e verfasserin  |4 aut 
700 1 |a Huang, Yu-Ting  |e verfasserin  |4 aut 
700 1 |a Wu, Wen-Wei  |e verfasserin  |4 aut 
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