Ab initio simulation of diffractometer instrumental function for high-resolution X-ray diffraction
Modeling of the X-ray diffractometer instrumental function for a given optics configuration is important both for planning experiments and for the analysis of measured data. A fast and universal method for instrumental function simulation, suitable for fully automated computer realization and descri...
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 48(2015), Pt 3 vom: 01. Juni, Seite 679-689 |
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| Weitere Verfasser: | , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2015
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article ab initio simulation diffractometer instrumental function high-resolution X-ray diffraction |