The use of soft X-rays near the carbon edge of absorption (270-300 eV) greatly enhances studies in various branches of science. However, the choice of reflecting coatings for mirrors operating in free-electron and X-ray free-electron laser (FEL and XFEL) beamlines in this spectral range is not so ev...
Détails bibliographiques
| Publié dans: | Journal of synchrotron radiation. - 1994. - 22(2015), 2 vom: 07. März, Seite 348-53
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| Auteur principal: |
Kozhevnikov, I V
(Auteur) |
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| Autres auteurs: |
Filatova, E O,
Sokolov, A A,
Konashuk, A S,
Siewert, F,
Störmer, M,
Gaudin, J,
Keitel, B,
Samoylova, L,
Sinn, H |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2015
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| Accès à la collection: | Journal of synchrotron radiation
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| Sujets: | Journal Article
Research Support, Non-U.S. Gov't
XFEL mirrors
in-depth profile
inverse problem
soft X-ray optics |
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