Comparative study of the X-ray reflectivity and in-depth profile of a-C, B₄C and Ni coatings at 0.1-2 keV
The use of soft X-rays near the carbon edge of absorption (270-300 eV) greatly enhances studies in various branches of science. However, the choice of reflecting coatings for mirrors operating in free-electron and X-ray free-electron laser (FEL and XFEL) beamlines in this spectral range is not so ev...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 22(2015), 2 vom: 07. März, Seite 348-53
|
|---|
| 1. Verfasser: |
Kozhevnikov, I V
(VerfasserIn) |
|---|
| Weitere Verfasser: |
Filatova, E O,
Sokolov, A A,
Konashuk, A S,
Siewert, F,
Störmer, M,
Gaudin, J,
Keitel, B,
Samoylova, L,
Sinn, H |
|---|
| Format: | Online-Aufsatz
|
|---|
| Sprache: | English |
|---|
| Veröffentlicht: |
2015
|
|---|
| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
|
|---|
| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
XFEL mirrors
in-depth profile
inverse problem
soft X-ray optics |
|---|