APA Zitierstil

Kozhevnikov, I. V., Filatova, E. O., Sokolov, A. A., Konashuk, A. S., Siewert, F., Störmer, M., . . . Sinn, H. (2015). Comparative study of the X-ray reflectivity and in-depth profile of a-C, B₄C and Ni coatings at 0.1-2 keV. Journal of synchrotron radiation, 22(2), 348. https://doi.org/10.1107/S1600577515000430

Chicago Zitierstil

Kozhevnikov, I V., et al. "Comparative Study of the X-ray Reflectivity and In-depth Profile of A-C, B₄C and Ni Coatings at 0.1-2 KeV." Journal of Synchrotron Radiation 22, no. 2 (2015): 348. https://dx.doi.org/10.1107/S1600577515000430.

MLA Zitierstil

Kozhevnikov, I V., et al. "Comparative Study of the X-ray Reflectivity and In-depth Profile of A-C, B₄C and Ni Coatings at 0.1-2 KeV." Journal of Synchrotron Radiation, vol. 22, no. 2, 2015, p. 348.