In situ synchrotron X-ray diffraction analysis of deformation behaviour in Ti-Ni-based thin films

In situ synchrotron X-ray diffraction analysis of deformation behaviour in Ti-Ni-based thin films

Deformation mechanisms of as-deposited and post-annealed Ti50.2Ni49.6, Ti50.3Ni46.2Cu3.5 and Ti48.5Ni40.8Cu7.5 thin films were investigated using the in situ synchrotron X-ray diffraction technique. Results showed that initial crystalline phases determined the deformation mechanisms of all the films...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 22(2015), 1 vom: 21. Jan., Seite 34-41
1. Verfasser: Wang, Hong (VerfasserIn)
Weitere Verfasser: Sun, Guangai, Wang, Xiaolin, Chen, Bo, Zu, Xiaotao, Liu, Yanping, Li, Liangbin, Pan, Guoqiang, Sheng, Liusi, Liu, Yaoguang, Fu, Yong Qing
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2015
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Research Support, Non-U.S. Gov't Ti–Ni deformation behaviour detwinning shape memory synchrotron X-ray diffraction thin film
Beschreibung
Zusammenfassung:Deformation mechanisms of as-deposited and post-annealed Ti50.2Ni49.6, Ti50.3Ni46.2Cu3.5 and Ti48.5Ni40.8Cu7.5 thin films were investigated using the in situ synchrotron X-ray diffraction technique. Results showed that initial crystalline phases determined the deformation mechanisms of all the films during tensile loading. For the films dominated by monoclinic martensites (B19'), tensile stress induced the detwinning of 〈011〉 type-II twins and resulted in the preferred orientations of (002)B19' parallel to the loading direction (∥ LD) and (020)B19' perpendicular to the LD (⊥ LD). For the films dominated by austenite (B2), the austenite directly transformed into martensitic variants (B19') with preferred orientations of (002)B19' ∥ LD and (020)B19' ⊥ LD. For the Ti50.3Ni46.2Cu3.5 and Ti48.1Ni40.8Cu7.5 films, martensitic transformation temperatures decreased apparently after post-annealing because of the large thermal stress generated in the films due to the large differences in thermal expansion coefficients between the film and substrate
Beschreibung:Date Completed 30.03.2015
Date Revised 18.04.2016
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775
DOI:10.1107/S1600577514021031