Full-field X-ray reflection microscopy of epitaxial thin-films
Novel X-ray imaging of structural domains in a ferroelectric epitaxial thin film using diffraction contrast is presented. The full-field hard X-ray microscope uses the surface scattering signal, in a reflectivity or diffraction experiment, to spatially resolve the local structure with 70 nm lateral...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 21(2014), Pt 6 vom: 01. Nov., Seite 1252-61
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| 1. Verfasser: |
Laanait, Nouamane
(VerfasserIn) |
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| Weitere Verfasser: |
Zhang, Zhan,
Schlepütz, Christian M,
Vila-Comamala, Joan,
Highland, Matthew J,
Fenter, Paul |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2014
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
Research Support, U.S. Gov't, Non-P.H.S.
X-ray microscopy
X-ray surface diffraction
interfaces and thin films
materials science |
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