Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction
In X-ray interference fringes accompanied by mirage diffraction, variations have been observed in the spacing and position of the fringes from a plane-parallel Si single crystal fixed at one end as a function of distance from the incident plane of the X-rays to the free crystal end. The variations c...
Veröffentlicht in: | Journal of applied crystallography. - 1998. - 46(2013), Pt 5 vom: 01. Okt., Seite 1261-1265 |
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1. Verfasser: | |
Weitere Verfasser: | , , , , |
Format: | Aufsatz |
Sprache: | English |
Veröffentlicht: |
2013
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Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
Schlagworte: | Journal Article distorted crystals dynamic theory of X-ray diffraction interference fringes mirage fringes strain distribution strain gradients |