Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction

In X-ray interference fringes accompanied by mirage diffraction, variations have been observed in the spacing and position of the fringes from a plane-parallel Si single crystal fixed at one end as a function of distance from the incident plane of the X-rays to the free crystal end. The variations c...

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Veröffentlicht in:Journal of applied crystallography. - 1998. - 46(2013), Pt 5 vom: 01. Okt., Seite 1261-1265
1. Verfasser: Jongsukswat, Sukswat (VerfasserIn)
Weitere Verfasser: Fukamachi, Tomoe, Ju, Dongying, Negishi, Riichirou, Hirano, Keiichi, Kawamura, Takaaki
Format: Aufsatz
Sprache:English
Veröffentlicht: 2013
Zugriff auf das übergeordnete Werk:Journal of applied crystallography
Schlagworte:Journal Article distorted crystals dynamic theory of X-ray diffraction interference fringes mirage fringes strain distribution strain gradients