Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction
In X-ray interference fringes accompanied by mirage diffraction, variations have been observed in the spacing and position of the fringes from a plane-parallel Si single crystal fixed at one end as a function of distance from the incident plane of the X-rays to the free crystal end. The variations c...
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 46(2013), Pt 5 vom: 01. Okt., Seite 1261-1265 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2013
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article distorted crystals dynamic theory of X-ray diffraction interference fringes mirage fringes strain distribution strain gradients |
| Zusammenfassung: | In X-ray interference fringes accompanied by mirage diffraction, variations have been observed in the spacing and position of the fringes from a plane-parallel Si single crystal fixed at one end as a function of distance from the incident plane of the X-rays to the free crystal end. The variations can be explained by distortion of the sample crystal due to gravity. From the variations and positions of the fringes, the strain gradient of the crystal has been determined. The distribution of the observed strain agrees with that expected from rod theory except for residual strain. When the distortion is large, the observed strain distribution does not agree with that expected from rod theory |
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| Beschreibung: | Date Revised 21.10.2021 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
| ISSN: | 0021-8898 |