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|a pubmed25n0770.xml
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|a (DE-627)NLM231183305
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|a (NLM)24068841
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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|a Jongsukswat, Sukswat
|e verfasserin
|4 aut
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|a Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction
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|c 2013
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|a Text
|b txt
|2 rdacontent
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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| 338 |
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|a Band
|b nc
|2 rdacarrier
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|a Date Revised 21.10.2021
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a In X-ray interference fringes accompanied by mirage diffraction, variations have been observed in the spacing and position of the fringes from a plane-parallel Si single crystal fixed at one end as a function of distance from the incident plane of the X-rays to the free crystal end. The variations can be explained by distortion of the sample crystal due to gravity. From the variations and positions of the fringes, the strain gradient of the crystal has been determined. The distribution of the observed strain agrees with that expected from rod theory except for residual strain. When the distortion is large, the observed strain distribution does not agree with that expected from rod theory
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|a Journal Article
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|a distorted crystals
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|a dynamic theory of X-ray diffraction
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|a interference fringes
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|a mirage fringes
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|a strain distribution
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|a strain gradients
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| 700 |
1 |
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|a Fukamachi, Tomoe
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Ju, Dongying
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Negishi, Riichirou
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Hirano, Keiichi
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Kawamura, Takaaki
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of applied crystallography
|d 1998
|g 46(2013), Pt 5 vom: 01. Okt., Seite 1261-1265
|w (DE-627)NLM098121561
|x 0021-8898
|7 nnns
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| 773 |
1 |
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|g volume:46
|g year:2013
|g number:Pt 5
|g day:01
|g month:10
|g pages:1261-1265
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|a GBV_USEFLAG_A
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|a SYSFLAG_A
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|a GBV_NLM
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|a GBV_ILN_350
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|a AR
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|d 46
|j 2013
|e Pt 5
|b 01
|c 10
|h 1261-1265
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