Interface characterization of B4C-based multilayers by X-ray grazing-incidence reflectivity and diffuse scattering

B4C-based multilayers have important applications for soft to hard X-rays. In this paper, X-ray grazing-incidence reflectivity and diffuse scattering, combining various analysis methods, were used to characterize the structure of B4C-based multilayers including layer thickness, density, interfacial...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 20(2013), Pt 3 vom: 10. Mai, Seite 449-54
1. Verfasser: Jiang, Hui (VerfasserIn)
Weitere Verfasser: Wang, Zhanshan, Zhu, Jingtao
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2013
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article X-ray reflectivity aging boron carbide diffuse scattering interface multilayer Boron Compounds boron carbonitride Carbon 7440-44-0