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231224s2012 xx |||||o 00| ||eng c |
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|a 10.1002/adma.201203033
|2 doi
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|a eng
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|a Wildanger, Dominik
|e verfasserin
|4 aut
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|a Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-ångström emitter localization
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|c 2012
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|a Text
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|a ƒaComputermedien
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|a Date Completed 01.05.2013
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|a Date Revised 22.03.2024
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|a published: Print-Electronic
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|a Citation Status MEDLINE
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|a Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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|a Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm
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|a Journal Article
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|a Research Support, Non-U.S. Gov't
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|a Solutions
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|a Patton, Brian R
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|a Schill, Heiko
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|a Marseglia, Luca
|e verfasserin
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|a Hadden, J P
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|a Knauer, Sebastian
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|a Schönle, Andreas
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|a Rarity, John G
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|a O'Brien, Jeremy L
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|a Hell, Stefan W
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|a Smith, Jason M
|e verfasserin
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|t Advanced materials (Deerfield Beach, Fla.)
|d 1998
|g 24(2012), 44 vom: 20. Nov., Seite OP309-13
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|x 1521-4095
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|g volume:24
|g year:2012
|g number:44
|g day:20
|g month:11
|g pages:OP309-13
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