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231224s2012 xx |||||o 00| ||eng c |
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|a 10.1107/S0909049512023813
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|a eng
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|a Feser, M
|e verfasserin
|4 aut
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|a Advantages of a synchrotron bending magnet as the sample illuminator for a wide-field X-ray microscope
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|c 2012
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|a Text
|b txt
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|a ƒaComputermedien
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|a ƒa Online-Ressource
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|a Date Completed 10.01.2013
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|a Date Revised 17.08.2012
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a In this paper the choice between bending magnets and insertion devices as sample illuminators for a hard X-ray full-field microscope is investigated. An optimized bending-magnet beamline design is presented. Its imaging speed is very competitive with the performance of similar microscopes installed currently at insertion-device beamlines. The fact that imaging X-ray microscopes can accept a large phase space makes them very well suited to the output characteristics of bending magnets which are often a plentiful and paid-for resource. There exist opportunities at all synchrotron light sources to take advantage of this finding to build bending-magnet beamlines that are dedicated to transmission X-ray microscope facilities. It is expected that demand for such facilities will increase as three-dimensional tomography becomes routine and advanced techniques such as mosaic tomography and XANES tomography (taking three-dimensional tomograms at different energies to highlight elemental and chemical differences) become more widespread
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|a Journal Article
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|a Research Support, U.S. Gov't, Non-P.H.S.
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|a Howells, M R
|e verfasserin
|4 aut
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|a Kirz, J
|e verfasserin
|4 aut
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|a Rudati, J
|e verfasserin
|4 aut
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|a Yun, W
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 19(2012), Pt 5 vom: 05. Sept., Seite 751-8
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|x 1600-5775
|7 nnas
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|g volume:19
|g year:2012
|g number:Pt 5
|g day:05
|g month:09
|g pages:751-8
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|u http://dx.doi.org/10.1107/S0909049512023813
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