Advantages of a synchrotron bending magnet as the sample illuminator for a wide-field X-ray microscope

In this paper the choice between bending magnets and insertion devices as sample illuminators for a hard X-ray full-field microscope is investigated. An optimized bending-magnet beamline design is presented. Its imaging speed is very competitive with the performance of similar microscopes installed...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 19(2012), Pt 5 vom: 05. Sept., Seite 751-8
1. Verfasser: Feser, M (VerfasserIn)
Weitere Verfasser: Howells, M R, Kirz, J, Rudati, J, Yun, W
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2012
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Research Support, U.S. Gov't, Non-P.H.S.
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520 |a In this paper the choice between bending magnets and insertion devices as sample illuminators for a hard X-ray full-field microscope is investigated. An optimized bending-magnet beamline design is presented. Its imaging speed is very competitive with the performance of similar microscopes installed currently at insertion-device beamlines. The fact that imaging X-ray microscopes can accept a large phase space makes them very well suited to the output characteristics of bending magnets which are often a plentiful and paid-for resource. There exist opportunities at all synchrotron light sources to take advantage of this finding to build bending-magnet beamlines that are dedicated to transmission X-ray microscope facilities. It is expected that demand for such facilities will increase as three-dimensional tomography becomes routine and advanced techniques such as mosaic tomography and XANES tomography (taking three-dimensional tomograms at different energies to highlight elemental and chemical differences) become more widespread 
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700 1 |a Kirz, J  |e verfasserin  |4 aut 
700 1 |a Rudati, J  |e verfasserin  |4 aut 
700 1 |a Yun, W  |e verfasserin  |4 aut 
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