Advantages of a synchrotron bending magnet as the sample illuminator for a wide-field X-ray microscope
In this paper the choice between bending magnets and insertion devices as sample illuminators for a hard X-ray full-field microscope is investigated. An optimized bending-magnet beamline design is presented. Its imaging speed is very competitive with the performance of similar microscopes installed...
Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 19(2012), Pt 5 vom: 05. Sept., Seite 751-8 |
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Weitere Verfasser: | , , , |
Format: | Online-Aufsatz |
Sprache: | English |
Veröffentlicht: |
2012
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Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
Schlagworte: | Journal Article Research Support, U.S. Gov't, Non-P.H.S. |
Zusammenfassung: | In this paper the choice between bending magnets and insertion devices as sample illuminators for a hard X-ray full-field microscope is investigated. An optimized bending-magnet beamline design is presented. Its imaging speed is very competitive with the performance of similar microscopes installed currently at insertion-device beamlines. The fact that imaging X-ray microscopes can accept a large phase space makes them very well suited to the output characteristics of bending magnets which are often a plentiful and paid-for resource. There exist opportunities at all synchrotron light sources to take advantage of this finding to build bending-magnet beamlines that are dedicated to transmission X-ray microscope facilities. It is expected that demand for such facilities will increase as three-dimensional tomography becomes routine and advanced techniques such as mosaic tomography and XANES tomography (taking three-dimensional tomograms at different energies to highlight elemental and chemical differences) become more widespread |
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Beschreibung: | Date Completed 10.01.2013 Date Revised 17.08.2012 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
ISSN: | 1600-5775 |
DOI: | 10.1107/S0909049512023813 |