Advantages of a synchrotron bending magnet as the sample illuminator for a wide-field X-ray microscope
In this paper the choice between bending magnets and insertion devices as sample illuminators for a hard X-ray full-field microscope is investigated. An optimized bending-magnet beamline design is presented. Its imaging speed is very competitive with the performance of similar microscopes installed...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 19(2012), Pt 5 vom: 05. Sept., Seite 751-8
|
|---|
| 1. Verfasser: |
Feser, M
(VerfasserIn) |
|---|
| Weitere Verfasser: |
Howells, M R,
Kirz, J,
Rudati, J,
Yun, W |
|---|
| Format: | Online-Aufsatz
|
|---|
| Sprache: | English |
|---|
| Veröffentlicht: |
2012
|
|---|
| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
|
|---|
| Schlagworte: | Journal Article
Research Support, U.S. Gov't, Non-P.H.S. |
|---|