Statistical pattern classification with binary variables

Binary random variables are regarded as random vectors in a binary-field (modulo-2) linear vector space. A characteristic function is defined and related results derived using this formulation. Minimax estimation of probability distributions using an entropy criterion is investigated, which leads to...

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Veröffentlicht in:IEEE transactions on pattern analysis and machine intelligence. - 1979. - 3(1981), 2 vom: 01. Feb., Seite 155-63
1. Verfasser: Young, T Y (VerfasserIn)
Weitere Verfasser: Liu, P S, Rondon, R J
Format: Aufsatz
Sprache:English
Veröffentlicht: 1981
Zugriff auf das übergeordnete Werk:IEEE transactions on pattern analysis and machine intelligence
Schlagworte:Journal Article
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245 1 0 |a Statistical pattern classification with binary variables 
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520 |a Binary random variables are regarded as random vectors in a binary-field (modulo-2) linear vector space. A characteristic function is defined and related results derived using this formulation. Minimax estimation of probability distributions using an entropy criterion is investigated, which leads to an A-distribution and bilinear discriminant functions. Nonparametric classification approaches using Hamming distances and their asymptotic properties are discussed. Experimental results are presented 
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700 1 |a Rondon, R J  |e verfasserin  |4 aut 
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