Deep-UV sensors based on SAW oscillators using low-temperature-grown AlN films on sapphires

High-quality epitaxial AlN films were deposited on sapphire substrates at low growth temperature using a helicon sputtering system. SAW filters fabricated on the AlN films exhibited excellent characteristics, with center frequency of 354.2 MHz, which corresponds to a phase velocity of 5667 m/s. An o...

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 58(2011), 8 vom: 19. Aug., Seite 1688-93
1. Verfasser: Laksana, Chipta (VerfasserIn)
Weitere Verfasser: Chen, Meei-Ru, Liang, Yen, Tzou, An-Jyeg, Kao, Hui-Ling, Jeng, Erik, Chen, Jyh, Chen, Hou-Guang, Jian, Sheng-Rui
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2011
Zugriff auf das übergeordnete Werk:IEEE transactions on ultrasonics, ferroelectrics, and frequency control
Schlagworte:Letter Research Support, Non-U.S. Gov't