An X-ray spectromicroscopy study of protein adsorption to polystyrene-poly(ethylene oxide) blends
Synchrotron-based X-ray photoemission electron microscopy (X-PEEM) and atomic force microscopy (AFM) were used to characterize the composition and surface morphology of thin films of a polystyrene-poly(ethylene oxide) blend (PS-PEO), spun cast from dichloromethane at various mass ratios and polymer...
Description complète
Détails bibliographiques
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1991. - 26(2010), 18 vom: 21. Sept., Seite 14759-65
|
|---|
| Auteur principal: |
Leung, Bonnie O
(Auteur) |
|---|
| Autres auteurs: |
Hitchcock, Adam P,
Brash, John L,
Scholl, Andreas,
Doran, Andrew |
|---|
| Format: | Article en ligne
|
|---|
| Langue: | English |
|---|
| Publié: |
2010
|
|---|
| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids
|
|---|
| Sujets: | Journal Article
Research Support, Non-U.S. Gov't
Research Support, U.S. Gov't, Non-P.H.S.
Polystyrenes
Proteins
Polyethylene Glycols
3WJQ0SDW1A |
|---|