An X-ray spectromicroscopy study of protein adsorption to polystyrene-poly(ethylene oxide) blends
Synchrotron-based X-ray photoemission electron microscopy (X-PEEM) and atomic force microscopy (AFM) were used to characterize the composition and surface morphology of thin films of a polystyrene-poly(ethylene oxide) blend (PS-PEO), spun cast from dichloromethane at various mass ratios and polymer...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 26(2010), 18 vom: 21. Sept., Seite 14759-65
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| 1. Verfasser: |
Leung, Bonnie O
(VerfasserIn) |
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| Weitere Verfasser: |
Hitchcock, Adam P,
Brash, John L,
Scholl, Andreas,
Doran, Andrew |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2010
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
Research Support, U.S. Gov't, Non-P.H.S.
Polystyrenes
Proteins
Polyethylene Glycols
3WJQ0SDW1A |
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